$electron backscatter diffraction$

#Electron backscatter diffraction software#

Recently, lab-based x-ray sources and detectors give a resolution comparable to synchrotron devices, but sub-micrometer spatial resolution is still hardly achievable without a compromise with respect to acquisition time and sample size for a sufficient peak-to-background ratio. For the latter, radiation from synchrotron (parallel, high flux) or lab-based (divergent, lower flux) x-ray sources passes through a specimen, and the projections of either the attenuation of intensity, phase contrast, or diffraction signals are collected and computationally reconstructed into a tomogram. and x-ray (micro-)computed tomography (CT) 3–5 3. For the non-destructive techniques, ultrasound tomography 1,2 1. In general, all the methods can be broadly grouped into non-destructive and destructive techniques. Several 3D characterization techniques, from (sub-)nanometers to millimeters, thus appear to promote the understanding of microstructure-property relations. The corrosion resistance of stainless steels, for example, depends on the 3D characteristics of grain boundaries the efficiency of polycrystalline solar cells is influenced by the 3D arrangement of grain boundaries, and the strain hardening behavior of aluminum alloys is affected by the 3D arrangement of dislocations and the shape and distribution of precipitations. Although microstructure characterization by microscopy techniques often results in two-dimensional images, microstructures are three-dimensional (3D) and the three-dimensionality certainly influences all properties of materials. Extended defects are, for example, grain and phase boundaries, dislocations, precipitations, voids, and elastic and plastic strain fields.

$electron backscatter diffraction$

The term microstructure refers to the totality of extended defects of crystalline materials, in terms of their kind, density, and spatial distribution. Understanding materials’ properties based on their microstructures is one of the key tasks of materials science. While bearing predominantly a pure tilt character, ∑9 GBs can be categorized into three groups based on correlative 3D morphologies and crystallography. In a 3D EBSD dataset of a size of 587 × 476 × 72 μm 3, we focused on the investigation of coincidence site lattice ∑9 GBs. When reconstructed grain boundary meshes are sufficiently smoothed, an angular resolution of ±4° is achieved. The angular accuracy of the system was determined to be ∼2.5°, which can be significantly improved with more accurate Z-spacing measurements. The two methods for Z-spacing measurements disagreed by about 10%, and the inaccurate calibration of the PFIB system was found to be the most probable reason for this discrepancy. Coherent twin grain boundaries (GBs) were used as an internal standard to check the removal rates measured by the side markers. The individual effects of both 1 μm diamond suspension and oxide polishing suspension polishing were studied in detail. For the measurement of removal thickness, the samples are featured with markers put on the perpendicular lateral surface, cut by plasma focused ion beam (PFIB) milling. Except for the case of error, the system runs without any user interference. The whole system is orchestrated by an in-house designed software, which is also able to track the process and report errors. We report the development of a fully automatic large-volume 3D electron backscatter diffraction (EBSD) system (ELAVO 3D), consisting of a scanning electron microscope (ZEISS crossbeam XB 1540) with a dedicated sample holder, an adapted polishing automaton (Saphir X-change, QATM), a collaborative robotic arm (Universal Robots UR5), and several in-house built devices.

Stefan Zaefferer: Conceptualization (lead) Data curation (equal) Formal analysis (equal) Funding acquisition (lead) Investigation (equal) Methodology (equal) Project administration (lead) Writing – original draft (supporting) Writing – review & editing (lead).

Naoyuki Sano: Project administration (equal) Writing – review & editing (equal).

Akira Taniyama: Conceptualization (equal) Funding acquisition (equal) Project administration (equal) Writing – review & editing (equal).

Kaori Kawano-Miyata: Conceptualization (equal) Funding acquisition (equal) Resources (equal) Writing – review & editing (equal).

Michael Herbig: Funding acquisition (supporting) Writing – review & editing (supporting).

Griffiths: Conceptualization (equal) Data curation (equal) Investigation (equal) Methodology (equal) Writing – review & editing (equal).

#Electron backscatter diffraction software#

Ivan Gonzalez: Methodology (equal) Resources (equal) Software (equal).Shao-Pu Tsai: Conceptualization (equal) Data curation (equal) Formal analysis (equal) Investigation (lead) Methodology (equal) Visualization (equal) Writing – original draft (equal) Writing – review & editing (equal).

$electron backscatter diffraction$